NVM Reliability Intern

Overview

• We are looking for a motivated Master’s student interested in semiconductor memory technology, reliability engineering, and data analysis.
• The project will investigate activation energy in embedded RRAM devices and develop a practical model for predicting retention lifetime.
• Candidate profile: Pursuing an MSc in Electrical Engineering, Applied Physics, Nanotechnology, Materials Science, Semiconductor Engineering, or a related discipline Strong analytical skills and an interest in semiconductor device physics and reliability Familiarity with statistical data analysis and scientific modeling Experience with Python, MATLAB, or similar data-analysis tools Ability to conduct an independent literature review and communicate technical findings clearly Curious, structured, and comfortable working with experts in a multidisciplinary environment More information about NXP in the Netherlands..